Capacitance measurement method employing floating gate of semiconductor device

ABSTRACT

A capacitance measurement method employing a floating gate of a semiconductor device in a circuit having a MOSFET in which a drain is connected to a ground and a source and a gate are connected to each other, and a capacitor having a capacitance C r  connected to the gate, includes: obtaining a slope S from a relationship between voltage V s  of the source and a voltage V f  applied to the capacitor; setting a standard slope S 0  as a y-intercept of a first-order linear equation obtained from a relationship between the slope S depending on the source current I s  and the V o  (I s ); and calculating a gate-to-drain overlap capacitance C dgo  of the MOSFET based on a capacitance C r  of the capacitor and the standard slop S 0 .

FIELD OF THE INVENTION

The present invention relates, in general, to a capacitance measurement method and more particularly, to a capacitance measurement method employing a floating gate of a semiconductor device.

BACKGROUND OF THE INVENTION

Presently, evaluation of the interconnect capacitance might take parasitic effects and requires a technique capable of handling complicated test equipment. To the contrary, quasi DC measurement structures provide several methods of evaluating the interconnect capacitance at a narrow test area. A floating gate capacitance measurement method is one of the methods. [C. Kortekaas, “on-chip Quasi-static Floating-gate capacitance Measurement Method”, Proc. IEEE Int. Conf. ON Microelectronic Test Structures, pp. 109-113, Vol3, March 1990]

FIG. 1 is an equivalent circuit diagram of a floating gate structure. The floating gate structure includes one MOSFET M and two first and second capacitors C_(r) and C_(m). The first capacitor C_(r) is a reference capacitance, and the second capacitor C_(m) is a capacitance to be measured. For example, the MOSFET M (P-channel MOSFET) can be a sense transistor, and can have a drain connected to the ground and a source and a bulk set to the same potential. This construction can prevent variation in the threshold voltage, which is caused by the potential between the source and the bulk. Further, the first capacitor C_(r) has one end connected to voltage V_(f), and the second capacitor C_(m) is connected to a ground gnd.

In the prior art, the capacitance measurement method is performed by measuring a voltage V_(s) depending on the voltage V_(f) while constantly supplying current to the MOSFET M in a saturation region (−V_(ds)>−V_(gs)+V_(t)). Of course, in the case of an N-channel MOSFET, a voltage −V_(s) depending on a voltage −V_(f) can be measured while constantly supplying current to the MOSFET in a saturation region (V_(ds)>V_(gs)+V_(t)).

In this case, the voltage V_(s) connected to the source of the MOSFET M varies as much as variation in the voltage at the floating gate due to a source-follower characteristic. Consequently, in the V_(f)-V_(s) relationship graph, the slope between V_(f)-V_(s) depends on the first capacitor C_(r) and the second capacitor C_(m):

V _(s) =S*V _(f) +V _(o)(I),  Equation 1

where S=C_(r)/(C_(r)+C_(m)), and V_(o) (I) indicates the voltage of the source node when current of 1 ampere is applied to the MOSFET when V_(f) is 0 Volts.

The capacitance of the second capacitor C_(m), which will be measured according to Equation 1 and a slope formula, can be expressed as C_(m)=(1−S)/S*C_(r).

However, when employing the source-flower characteristic of the MOSFET, a charge effect at the floating gate node, which is caused by the gate-to-drain overlap capacitance depending on variation in the voltage between the drain and the floating gate node, is not taken into consideration. That is, the influence of the overlap capacitance between the gate and the drain is not taken into consideration. Accordingly, a measured capacitance could be erroneous, in that, it has an error caused by the gate-to-drain overlap capacitance.

SUMMARY OF THE INVENTION

It is, therefore, an object of the present invention to provide a capacitance measurement method employing a floating gate of a semiconductor device, in which when measuring an interconnect capacitance by using a reference capacitance and a source-follower MOSFET, the influence by the gate-to-drain overlap capacitance can be minimized.

It is another object of the present invention to provide a capacitance measurement method employing a floating gate of a semiconductor device, in which an overlap capacitance of the gate-drain and the gate-source can be measured.

It is yet another object of the present invention to provide a capacitance measurement method employing a floating gate of a semiconductor device, in which when a gate-to-drain overlap capacitance is known, an unknown capacitance connected to a floating gate can be measured based on the known gate-to-drain overlap capacitance.

It is yet another object of the present invention to provide a capacitance measurement method employing a floating gate of a semiconductor device, in which when two known capacitances are connected to a floating gate, a mismatching characteristic between the two capacitances can be analyzed.

In accordance with a first embodiment of the present invention, there is provided a capacitance measurement method employing a floating gate of a semiconductor device in a circuit having a MOSFET in which a drain is connected to a ground and a source and a gate are connected to each other, and a capacitor having a capacitance C_(r) connected to the gate, the method including: measuring a voltage V_(s) of the source by applying a voltage V_(f) to the capacitor in a state where a static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s) when the voltage V_(f) is zero to V_(o) (I_(s)), and obtaining a slope S from a relationship between the voltage V_(s) and the voltage V_(f); setting a standard slope S₀ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S depending on the source current I_(s) and the V_(o) (I_(s)); and calculating a gate-to-drain overlap capacitance C_(dgo) of the MOSFET based on a capacitance C_(r) of the capacitor and the standard slop S₀.

In accordance with a second embodiment of the present invention, there is provided a capacitance measurement method employing a floating gate of a semiconductor device in a circuit having a MOSFET in which a drain is connected to a ground and a source and a gate are connected to each other, a reference capacitor having a capacitance C_(r) connected to the gate, and a measurement capacitor having a capacitance C_(m) connected to the reference capacitor, wherein a node between the reference capacitor and one end of the measurement capacitor is connected to the gate of the MOSFET, and the other end of the measurement capacitor is connected to the ground, the method including:

measuring a voltage V_(s) of the source by applying a voltage V_(f) to the reference capacitor to which the measurement capacitor is connected in a state where a static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s) when the voltage V_(f) is zero to V_(o) (I_(s)), and obtaining a slope S from a relationship between the voltage V_(s) and the voltage V_(f); setting a standard slope S₁ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S depending on the source current I_(s) and the V_(o) (I_(s)); removing the measurement capacitor from the circuit; measuring a voltage V_(s)′ of the source by applying the voltage V_(f) to the reference capacitor in a state where the static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s)′ when the voltage V_(f) is zero to V_(o)′ (I_(s)), and obtaining a slope S′ from a relationship between the voltage V_(s)′ and the voltage V_(f); setting a standard slope S₀ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S′ depending on the source current I_(s) and the V_(o)′ (I_(s)); and calculating the capacitance C_(m) of the measurement capacitor.

In accordance with a third embodiment of the present invention, there is provided a capacitance measurement method employing a floating gate of a semiconductor device in a circuit having a MOSFET in which a drain is connected to a ground and, a source and a gate are connected to each other, and a first capacitor having a capacitance C_(r) connected to the gate, and a second capacitor having a capacitance C_(m) connected to the first capacitor, wherein a node between the first capacitor and one end of the second capacitor is connected to the gate of the MOSFET, and the other end of the second capacitor is connected to the ground, the method including: measuring a voltage V_(s) of the source by applying a voltage V_(f) to the first capacitor to which the second capacitor is connected in a state where a static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s) when the voltage V_(f) is zero to V_(o) (I_(s)), and obtaining a slope S from a relationship between the voltage V_(s) and the voltage V_(f); setting a standard slope S₁ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S depending on the source current I_(s) and the V_(o) (I_(s)); removing the second capacitor from the circuit; measuring a voltage V_(s)′ of the source by applying the voltage V_(f) to the first capacitor in a state where the static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s)′ when the voltage V_(f) is zero to V_(o)′ (I_(s)), and obtaining a slope S′ from a relationship between the voltage V_(s)′ and the voltage V_(f); setting a standard slope S₀ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S′ depending on the source current I_(s) and the V_(o)′ (I_(s)); and analyzing a mismatching characteristic between the first and the second capacitor based on the standard slopes S₀ and S₁.

As described above, the present invention can minimize the effect of the gate-to-drain overlap capacitance when measuring an interconnect capacitance by using a reference capacitance and a source-flower MOSFET. Of course, a lower capacitance can be measured, measurement resolutions of a capacitor to be measured can be improved, and a test pattern area of a small MOSFET can be reduced. Furthermore, a MOSFET having a high overlap capacitance of a gate-drain/the gate-source can also be used for measurement.

Further, an overlap capacitance of the gate-drain and the gate-source can be measured.

Further, in accordance with the present invention, when a gate-to-drain overlap capacitance is known, an unknown capacitance connected to a floating gate can be measured based on the known gate-to-drain overlap capacitance.

Furthermore, according to the present invention, when two known capacitances are connected to a floating gate, a mismatching characteristic between the two capacitances can be analyzed.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other objects and features of the present invention will become apparent from the following description of embodiments given in conjunction with the accompanying drawings, in which:

FIG. 1 is an equivalent circuit diagram of a floating gate structure having a reference capacitance and an unknown capacitance;

FIG. 2 is an equivalent circuit diagram of a floating gate structure when one terminal of an unknown capacitor is opened from the ground;

FIG. 3 is a graph showing the relationship between V_(s)-V_(f) depending on I_(s) when one terminal of an unknown capacitor is opened from the ground;

FIG. 4 is a graph showing the relationship between V_(s)-V_(f) depending on I_(s) when one terminal of unknown capacitances C_(m1)=C_(m) is opened from the ground;

FIG. 5 is a graph showing the relationship between V_(s)-V_(f) in the case of two I_(s), that is, 1e ⁻⁶ A/μm and 3e ⁻⁴ A/μm;

FIG. 6 is a graph showing the relationship between S-V_(o) (I) for extracting a standard slope; and

FIG. 7 is a graph showing the relationship between the C_(m)/C_(r) ratio and an error value depending on each method.

DETAILED DESCRIPTION OF THE EMBODIMENTS

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that they can be readily understood by those skilled in the art.

FIG. 1 is an equivalent circuit diagram of a floating gate structure having a reference capacitance and an unknown capacitance.

In FIG. 1, even if the voltage V_(f) applied to the reference capacitor C_(r) or the voltage applied to the drain or the source of the MOSFET M changes and, if there is no current induced from another node to the floating gate node and the amount of current, which is generated and becomes distinct within the floating gate node is negligible, the floating gate node will be in a neutral condition, that is, at an initial value, a total amount of internal charge is 0. In other words, it is considered that the charge amount of the floating gate node is unchanged. It can be expressed in Equation 2. This condition infers that V_(g) (t) is constant as time goes by (i.e., V_(g)(t)=V_(g)).

Integ(I,t)=C _(r)*(V _(g)(t)−V _(f))+C _(m) *V _(g)(t)+C _(dgo)*(V _(g)(t)−V _(d))+C _(sgo)*(V _(g)(t)−V _(s))+C _(bgo)*(V _(g)(t)−V_(s))=0,  Equation 2

where V_(g) (t) indicates the voltage of the floating gate node. Further, C_(dgo) indicates a gate-to-drain overlap capacitance, C_(sgo) indicates a gate-to-source overlap capacitance, and C_(bgo) indicates a gate-to-bulk overlap capacitance.

Furthermore, V_(d)=ground=0, and V_(g)(t)−V_(th)=V_(s) from the source-follower characteristic. V_(th) is the threshold voltage. If the measurement condition is applied to Equation 2, Equation 2 can be arranged to become Equation 3:

C _(r)*(V _(s) +V _(th) −V _(f))+C _(m)*(V _(s) +V _(th))+C _(dgo)*(V _(s) +V _(th) −V _(d))+C _(sgo)*(V _(th))+C _(bgo)*(V _(th))=0.  Equation 3

If Equation 3 is differentiated with respect to the voltage V_(f), dV_(th)/dV_(f)=0 since the threshold voltage V_(th) is a constant. Assuming that dV_(s)/dV_(f)=S, Equation 4 is obtained:

C _(r)*(S−1)+C _(m) *S+C _(dgo) *S=0.  Equation 4

As shown in Equation 4, the slope is influenced by the gate-to-drain overlap capacitance in the relationship graph between the voltage V_(s) and the voltage V_(f). In this case, the influence of the gate-to-drain overlap capacitance can be negligible when the capacitance C_(r) for the reference capacitor and the capacitance C_(m) for the measurement capacitor are much higher than the gate-to-drain overlap capacitance C_(dgo), but cannot be negligible when the capacitance C_(r) for the reference capacitor and the capacitance C_(m) for the measurement capacitor are not much higher than the gate-to-drain overlap capacitance C_(dgo).

In other words, it can be seen that the gate-to-drain overlap capacitance has an effect on measurement resolutions of the measurement capacitor. In other words, it is meant that if the gate-to-drain overlap capacitance C_(dgo) is not negligible, the measurement resolutions can be improved.

Further, dV_(s)/dV_(f) is influenced by a current to be measured due to variation in the charges in the channel region of the MOSFET M according to the static current I_(s) applied to measure the voltage V_(s).

A method of removing the influence and measuring the slope accurately is described below.

1. The drain node of the MOSFET M is set to the ground and the static current I_(s) is applied to a node connected to the source and the bulk. When the voltage V_(f) is 0, the voltage V_(s) of the source is measured to obtain V_(o) (I_(s)). A slope S (I_(s)) is obtained by measuring the source voltage V_(s) while changing the voltage V_(f).

2. V_(o) (I_(s)) and the slope S (I_(s)) depending on each I_(s) are measured while changing the source current I_(s).

3. After, V_(o) (I_(s)) depending on the source current I_(s) is placed in an X axis and the slope S (I_(s)) is placed in a Y axis, the Y axis from a linear trend line and the slope value of an intercept thereof are set to a standard slope S_(n) of the structure.

In a case where one capacitor is connected to the floating gate, i.e., where one capacitor C_(r) is connected to the floating gate of the MOSFET M, as illustrated in FIG. 2.

A measurement method is as follows:

In the circuit structure, a standard slope S₀ is measured by the above method of measuring the slope S. Thereafter, if one of the gate-to-drain overlap capacitance C_(dgo) and the capacitance C_(r) of the capacitor is known, the other of the gate-to-drain overlap capacitance C_(dgo) and the capacitance C_(r) of the capacitor can be known from Equation 5:

C _(dgo)=(1−S ₀)/S _(o) *C _(r).  Equation 5

That is, the gate-to-drain overlap capacitance C_(dgo) can be calculated when the capacitance C_(r) is known.

In a case where two capacitors are connected to the floating gate, i.e., where a reference capacitor C_(r) and a measurement capacitor C_(m) are connected to the floating gate of the MOSFET M, as illustrated in FIG. 1.

A measurement method is as follows:

The terminal of the measurement capacitor C_(m) is opened and connected in the same manner as that one capacitor C_(r) is connected to the floating gate. The standard slope S₀ is measured by the above method of measuring the slope S of the structure.

While the terminal of the capacitor C_(m) is connected to the ground, a standard slope S₁ is measured by the above method of measuring the slope S.

The capacitance C_(m) of the measurement capacitor can be known, if the capacitance C_(r) of the reference capacitor is known, from Equation 6 or 7:

C _(m)=(1−S ₁)/S ₁ *C _(r) −C _(dgo), and  Equation 6

C _(m)=(1/S ₁−1/S ₀)*C _(r).  Equation 7

In Equation 6, the capacitance C_(m) of the measurement capacitor can be measured when the drain-to-gate overlap capacitance is known.

Method of analyzing matching characteristic of capacitance, i.e., where two capacitors are connected to the floating gate, as illustrated in FIG. 1. In this case, it is determined whether the two capacitors have the same value.

If the slopes S₁ and S₀ are measured by the above methods, the ratio of the values of the two capacitors can be calculated from Equation 8:

R=C _(m) /C _(r)=1/S ₁−1/S ₀.  Equation 8

In other words, it can be said that when the values approach 1, the two capacitors have the same value. That is, mismatching characteristic between the two capacitances can be analyzed.

In order to verify the above method, a 2D-numerical device simulator, that is, Technology Computer-Aided Design (TCAD) software for analyzing the electrical characteristics of a device based on a physical model was used.

Three test cases having three different capacitances C_(m) with respect to the same capacitance C_(r) are listed in Table 1. Respective capacitor values were obtained by using the 2D-numerical device simulator.

TABLE 1 Capacitance (fF) by 2-D Cases numerical calculation Capacitance C_(r) 1.922 Capacitance C_(m1) 1.804 Capacitance C_(m2) 0.637 Capacitance C_(m3) 0.396 Gate-to-drain overlap 0.339 capacitance C_(dgo)

The evaluation of the capacitances by the conventional method and the method disclosed in the present invention are listed in the following table 2.

TABLE 2 Ratio Error Case (real) Ratio (ext) Ratio (old) Ratio (ext) (old) C_(m1)/C_(r) 0.939 0.937 1.141 0.221 21.579 C_(m2)/C_(r) 0.332 0.330 0.527 0.508 58.838 C_(m3)/C_(r) 0.206 0.205 0.399 0.268 93.677 C_(dgo)/C_(r) 0.176 0.179 0.192 1.406  8.815

FIG. 3 is a graph showing the relationship between the voltage V_(s) and the voltage V_(f) when the capacitor C_(m) is opened, that is, when the equivalent circuit of FIG. 2 is useful.

FIG. 4 is a graph showing the relationship between the voltage V_(s) and the voltage V_(f) when the capacitor C_(m) is connected to the ground, that is, when the equivalent circuit of FIG. 1 is useful.

From FIG. 5, it can be seen that whenever the value of the capacitor C_(m) changes, the slope is varied in the relationship graph of the voltage V_(s) and the voltage V_(f). In the relationship graph between the voltage V_(s) and the voltage V_(f), the slope is slightly changed depending on the source current I_(s) with respect to the same capacitance C_(m).

Therefore, V_(o)=0, that is, the intercept with the Y axis, which is found from the relationship graph of the slope S and V_(o) (I_(s)) as in FIG. 6 by extracting the slope of V_(o) (I_(s)) and ΔV_(s)/ΔV_(f) when the voltage V_(f) is 0 with respect to each source current I_(s) is defined as the standard slope S_(n).

FIG. 7 illustrates the comparison results of ratios in which the conventional method and the method of the present invention, and a case where actual values are used (Ratio)=C_(m)/C_(r). From FIG. 7, it can be seen that the method of the present invention can remove error due to the gate-to-drain overlap capacitance C_(dgo) and can extract error of 1% or less even in a very small capacitance region.

As described above, the present invention can minimize the effect of the gate-to-drain overlap capacitance when measuring an interconnect capacitance by using a reference capacitance and a source-flower MOSFET. Of course, a lower capacitance can be measured, measurement resolutions of a capacitor to be measured can be improved, and a test pattern area of a small MOSFET can be reduced. Furthermore, a MOSFET having a high overlap capacitance of a gate-drain/the gate-source can also be used for measurement.

Further, an overlap capacitance of the gate-drain and the gate-source can be measured.

Further, in accordance with the present invention, when a gate-to-drain overlap capacitance is known, an unknown capacitance connected to a floating gate can be measured based on the known gate-to-drain overlap capacitance.

Furthermore, according to the present invention, when two known capacitances are connected to a floating gate, a mismatching characteristic between the two capacitances can be analyzed.

While the invention has been shown and described with respect to the embodiments, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the scope of the invention as defined in the following claims. 

1. A capacitance measurement method employing a floating gate of a semiconductor device in a circuit having a MOSFET in which a drain is connected to a ground, and a source and a gate are connected to each other, and a capacitor having a capacitance C_(r) connected to the gate, the method comprising the steps of: measuring a voltage V_(s) of the source by applying a voltage V_(f) to the capacitor in a state where a static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s) when the voltage V_(f) is zero to V_(o) (I_(s)), and obtaining a slope S from a relationship between the voltage V_(s) and the voltage V_(f); setting a standard slope S₀ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S depending on the source current I_(s) and the V_(o) (I_(s)); and calculating a gate-to-drain overlap capacitance C_(dgo) of the MOSFET based on a capacitance C_(r) of the capacitor and the standard slop S₀.
 2. The capacitance measurement method of claim 1, wherein the slope S is calculated from an equation: S=ΔV _(s) /ΔV _(f).
 3. The capacitance measurement method of claim 1, wherein the gate-to-drain overlap capacitance C_(dgo) of the MOSFET is calculated from an equation: C _(dgo)=(1−S ₀)/S ₀ *C _(r).
 4. A capacitance measurement method employing a floating gate of a semiconductor device in a circuit having a MOSFET in which a drain is connected to a ground, and a source and a gate are connected to each other, a reference capacitor having a capacitance C_(r) connected to the gate, and a measurement capacitor having a capacitance C_(m) connected to the reference capacitor, wherein a node between the reference capacitor and one end of the measurement capacitor is connected to the gate of the MOSFET, and the other end of the measurement capacitor is connected to the ground, the method comprising the steps of: measuring a voltage V_(s) of the source by applying a voltage V_(f) to the reference capacitor to which the measurement capacitor is connected in a state where a static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s) when the voltage V_(f) is zero to V_(o) (I_(s)), and obtaining a slope S from a relationship between the voltage V_(s) and the voltage V_(f); setting a standard slope S₁ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S depending on the source current I_(s) and the V_(o) (I_(s)); removing the measurement capacitor from the circuit; measuring a voltage V_(s)′ of the source by applying the voltage V_(f) to the reference capacitor in a state where the static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s)′ when the voltage V_(f) is zero to V_(o)′ (I_(s)), and obtaining a slope S′ from a relationship between the voltage V_(s)′ and the voltage V_(f); setting a standard slope S₀ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S′ depending on the source current I_(s) and the V_(o)′ (I_(s)); and calculating the capacitance C_(m) of the measurement capacitor.
 5. The capacitance measurement method of claim 4, wherein the slopes S and S′, respectively, are calculated from equations: S=

V _(s) /

V _(f); and S′=

V _(s) ′/

V _(f).
 6. The capacitance measurement method of claim 4, wherein the capacitance C_(m) of the measurement capacitor is calculated based on the standard slopes S₁ and S_(o) from an equation: C _(m)=(1/S ₁−1/S _(o))*C _(r).
 7. The capacitance measurement method of claim 4, wherein the step of calculating the capacitance C_(m) of the measurement capacitor includes: calculating a gate-to-drain overlap capacitance C_(dgo) of the MOSFET; and calculating the capacitance C_(m) of the measurement capacitor based on the standard slope S₁ and the gate-to-drain overlap capacitance C_(dgo) of the MOSFET.
 8. The capacitance measurement method of claim 7, wherein the gate-to-drain overlap capacitance C_(dgo) of the MOSFET is calculated from an equation: C _(dgo)=(1−S ₀)/S ₀ *C _(r).
 9. The capacitance measurement method of claim 7, wherein the capacitance C_(m) of the measurement capacitor is calculated from an equation: C _(m)=(1−S ₁)/S ₁ *C _(r) −C _(dgo).
 10. A capacitance measurement method employing a floating gate of a semiconductor device in a circuit having a MOSFET in which a drain is connected to a ground and a source and a gate are connected to each other, and a first capacitor having a capacitance C_(r) connected to the gate, and a second capacitor having a capacitance C_(m) connected to the first capacitor, wherein a node between the first capacitor and one end of the second capacitor is connected to the gate of the MOSFET, and the other end of the second capacitor is connected to the ground, the method comprising: measuring a voltage V_(s) of the source by applying a voltage V_(f) to the first capacitor to which the second capacitor is connected in a state where a static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s) when the voltage V_(f) is zero to V_(o) (I_(s)), and obtaining a slope S from a relationship between the voltage V_(s) and the voltage V_(f); setting a standard slope S₁ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S depending on the source current I_(s) and the V_(o) (I_(s)); removing the second capacitor from the circuit; measuring a voltage V_(s)′ of the source by applying the voltage V_(f) to the first capacitor in a state where the static current I_(s) is applied to the source of the MOSFET; setting the voltage V_(s)′ when the voltage V_(f) is zero to V_(o)′ (I_(s)), and obtaining a slope S′ from a relationship between the voltage V_(s)′ and the voltage V_(f); setting a standard slope S₀ as a y-intercept of a first-order linear equation obtained from a relationship between the slope S′ depending on the source current I_(s) and the V_(o)′ (I_(s)); and analyzing a mismatching characteristic between the first and the second capacitor based on the standard slopes S₀ and S₁.
 11. The capacitance measurement method of claim 10, wherein the slopes S and S′, respectively, are calculated from equations: S=

V _(s) /

V _(f); and S′=

V _(s) ′/

V _(f).
 12. The capacitance measurement method of claim 10, wherein the mismatching characteristic between the first and the second capacitor is calculated from an equation: R=C _(m) /C _(r)=1/S ₁−1/S ₀. 